A Single-event Transient Mitigation Technique for Bandgap Reference
Utilizing in Space Application
Abstract
This paper proposes a radiation-hardened-by-design (RHBD) technique
targeting single-event transient (SET) mitigation in bandgap reference
(BGR) circuits. The dual modular redundancy (DMR) technique used for BGR
ensures correct output voltage to the subsequent circuits. The BGR
output voltage is detected and clamped by two threshold voltages and
time-delayed switches further isolate SET pulses. The proposed BGR
circuit was fabricated in 28 nm bulk CMOS process. Laser experiments
illustrate that SET perturbation is almost eliminated when laser energy
is up to 1 nJ. The RHBD BGR is proven to be good substitute for space
applications.