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THESIS OBJECTIVES The objectives of this thesis are given as follows; - DEVELOPMENT OF SNMM TECHNIQUE: The first part of this thesis focuses on the design of an SNMM homemade technique. We start with an introductory chapter that provides a brief discussion of the techniques used for material characterization. The goal of the study is to design a developed SNMM technique that allows us to characterize semiconductors. Several simulation tests were conducted in order to achieve a system that the technology exists in the laboratory allows us to make this design realizable. The most complicated parts were the design of coaxial cavities, micro strip line resonators, and the probe tips. The design aims at our laboratory the SNMM technique as a possible application. Three different approaches have been implemented in our SNMM platform in order to achieve a good functioning of the system and high spatial resolution regarding material characterization domain. The use of the SNMM is not solely restricted to the imaging of semiconductor or conductor samples, as numerous studies have been able to image biological samples also . - DESIGN AN INTEGRATED SNMM-AFM PLATFORM SYSTEM: The second part of the thesis focuses on the integration of the two techniques. The integrated system design aiming at tightly combine an SNMM technique with a commercial AFM, in which different micro-strip line resonators were designed to ensure the proper functioning of the system. A quarter and half wavelength micro-strip line resonators have been well designed and made for this purpose. In this project, our goal is to characterize conductor materials like copper, a dielectric substrate (epoxy), Sio2, Graphene Oxide and Reduced Graphene Oxide, all these kind of materials have been tested in order to study their characteristics by using this technique. However, despite our efforts, we obtained significant data but were not able to verify automatically if the samples under test were analyzed appropriately during the scan.