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The This work is the term paper for the course AEP 6610, reviewing the techniques and development of  environmental scanning electron microscopes (ESEM) microscope (ESEM). The ESEM  provide the ability to image samples down to nanometer scale and without the necessity of high vacuum in the sample chamber and sample preparation. Therefore, samples can be imaged in its original hydrated state, preserving its dynamics, interior structures and morphology. Secondary electrons are collected to reveal the topology of the sample while back scattered electrons are collected to distinguish the element composition. In this paper, the resolution and limitation for ESEM will be are  presented. The applications of ESEM on both organic and inorganic materials will be are  discussed. Finally, future prospects an comparison with competing imaging technologies conclude  the paper.