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...
``No-beam'' failures are defined to start when the beam current drops below a given limit.
For several facilities this is currently not the case. ALBA, BESSY-II and LSLS-UVX consider a
closure of the photon shutters by an interlock equivalent to a loss of the electron beam.
For some facilities a ``no-beam'' failure stops
not when the beam is back to
the nominal current $I_{\hbox{nom}}$ but only when the interlock
is cleared that prevents the beamline shutters from opening
(ALBA, BESSY II, LNLS-UVX, SPring-8) or
when the insertion devices move back to their closed positions (SLS).
PETRA III adds an amount of time to allow for the warm-up of the optical components at the beamlines.
These practices are oriented to use a beam availability understood as photon beam availability.
Facilities are counting Here facilities count the time the photon beam is ready to be used at the beamlines.
``Low-beam-current'' failures
do vary significantly between facilities.
At Spring-8, for example, a beam decay of about 0.1\% starts a ``low-beam-current'' failure,
while at BESSY-II it starts only at 9\% beam decay.
The reason for this difference comes from the required current stability for the
experiments
that can vary significantly between light sources. experiments.
LNLS-UVX and PETRA III do not account for ``low-beam-current'' failures at all (
$I_{\hbox{tol}}$ = $I_{\hbox{min}}$).
...
A ``downtime'' often only ends after the photon shutter or insertion device control is
given back to the users, which is not compatible with the ``no-beam'' rule.
This can be solved by having additional failure types for ``photon-shutter-closed'' or
``insertion-devices-blocked-open''
while when there is not a ``no-beam'' failure.
The application of this
new metrics metric will disentangle failures of different nature.
A former ``downtime'' at ALBA would then be the sum of ``no-beam'' and ``photon-shutter-closed'' failures.
It would allow a better comparison to facilities like the
SLS, SLS
that do not have a global photon shutter interlock.
If several failures are recorded for a single incident,
then it should be recorded if
a one failure was preceded by another:
if the photon-shutters are interlocked, the beam is then dumped and afterwards it takes five
minutes until the insertion-devices are unblocked, then it should be visible from the failure
data that these were not three but
was rather only one
cause of interruption
in to user operation.
The authors
decided agreed to allow arbitrary limits for ``no-beam'' failures;
in practice this does not make a large difference:
situations are rare
at the evaluated facilities where the
stored current drops from
the nominal beam current to less than 50\% but not to zero.
``Low-beam-current'' failures vary significantly with the definition of the $I_{\mbox{tol}}$ limit.
Nevertheless comparing the tolerated beam decay is
still a useful
way
to judge
the promised current stability
of at a facility.
For those facilities where the limits are similar, the failure rates
will allow a
meaningful comparison of the reliability of the injection process.