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Nicholas Deutscher added The_impact_of_laser_sampling__.tex
about 8 years ago
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The impact of laser sampling errors prior to the board replacement needs to be assessed and corrected. \citep{Dohe2013} introduced a method to calculate and correct the laser sampling errors, based on spurious signals seen in a region of the spectrum that would otherwise be saturated due to atmospheric water vapour. This method, however, requires sufficient atmospheric H$_2$O and the averaging of many spectra to increase the signal to noise to enable the spurious signal to be observed. An alternative method takes advantage of the fact that most TCCON sites, including Wollongong, simultaneously measure both InGaAs and Si spectra. This correction method is detailed in \citep{Wunch2014}. Briefly, because the Si interferograms are double-sampled, the odd and even points should each contain all the necessary spectral information. The difference in the phase curves between the odd and even-only interferograms provides a measure of the laser sampling error.
