Figure 2: SEM images showing the
crystal ZIF-62 morphologies of a)ZIF-62-a, b)ZIF-62-b, c)ZIF-62-c,
d)AgZIF-62-a, e)AgZIF-62-b, and f)AgZIF-62-c. Black scale bar represents
1µm.
The
presence of silver ions within the structure was confirmed using SEM-EDS
onto the resulting particles, as shown in Figure S 1. The peaks at
around 1.1 keV, 8.6 keV and 9.5 keV show the presence of zinc, which is
the metal node for the ZIF-62 framework. The two peaks around 3.0 keV
and 3.1 keV show the presence of silver within the particles. The peak
at around 1.8 keV represents silicon as the particles were dispersed
onto a silicon wafer. This shows that zinc and silver are both present
within the ZIF-62 structure indicating that silver has been successfully
introduced into the structure.
Table 3: Measurement of Silver to Zinc ratio in silver-doped ZIF-62.