Figure 2: SEM images showing the crystal ZIF-62 morphologies of a)ZIF-62-a, b)ZIF-62-b, c)ZIF-62-c, d)AgZIF-62-a, e)AgZIF-62-b, and f)AgZIF-62-c. Black scale bar represents 1µm.
The presence of silver ions within the structure was confirmed using SEM-EDS onto the resulting particles, as shown in Figure S 1. The peaks at around 1.1 keV, 8.6 keV and 9.5 keV show the presence of zinc, which is the metal node for the ZIF-62 framework. The two peaks around 3.0 keV and 3.1 keV show the presence of silver within the particles. The peak at around 1.8 keV represents silicon as the particles were dispersed onto a silicon wafer. This shows that zinc and silver are both present within the ZIF-62 structure indicating that silver has been successfully introduced into the structure.
Table 3: Measurement of Silver to Zinc ratio in silver-doped ZIF-62.