Microscopy-based inspection of the stems
The surface and cross-sectional characteristics of the stems of both the
invasive and native species were observed and imaged via a super
resolution system (Liyang Precision Machinery, Chengdu, China). To
obtain a high resolution image of the surface structure of stems, twenty
multi-focus images with shallow depth of field were taken for each stem,
and fused into a higher resolution image using the Zerene Stacker
software (Zerene Systems LLC, Richland, WA, USA).