Abstract

The design and characterisation of integrated circuits on SOI aimed at comparing two different measurement methods is proposed. A first set of designs will provide a direct comparison between the wavelength responses of two sample components with distinct levels of back-reflection. A selected pair of samples will then be used as partial mirrors in an on-chip Michelson interferometer arrangement and back-reflection levels versus wavelength will be extracted from SiEPIC automated measurement results. Sensitivities of the two measurement methods will be compared.