In this section, the faul–tolerant cappacity of SC compared with
conventional approach will be con- sidered. This is can be seen as the
most important feature when investigate SC in the applications. We will
equally make a comparison between two these approaches by stochastically
injecting different level of soft error into the internal circuit and
calculating the generated error corresponding to each implementation.
Based on the recent approach in
[16], the injection of soft
error in case of a 2–input operators can be illustrated in
Fig.4.13. The others computing
elements will be injected this transient error by the