Fault-tolerance Comparison

\label{fault-tolerance-comparison}
In this section, the faul–tolerant cappacity of SC compared with conventional approach will be con- sidered. This is can be seen as the most important feature when investigate SC in the applications. We will equally make a comparison between two these approaches by stochastically injecting different level of soft error into the internal circuit and calculating the generated error corresponding to each implementation.
Based on the recent approach in [16], the injection of soft error in case of a 2–input operators can be illustrated in Fig.4.13. The others computing elements will be injected this transient error by the
  1. Noisy original image (b) Conventional approach