Hetero-structure Junctionless MOSFET with high-k corner spacer for
high-speed and energy-efficient applications
Abstract
In this research work, Hetero-structure Junction-less MOSFET
having a Silicon-Germanium source and high-k inner corner spacer
is proposed and investigated. In this article, we have shown that the
introduction of a high-k dielectric material in the inner corner
spacer and a low-k dielectric material in the rest of the spacer
in the optimally designed device leads to a substantial reduction in
parasitic capacitances, resulting in higher operating speed. It was also
shown that proper doping in the drain-source underlaps regime, can
improve the short channel performance (SCP) of the device by increasing
the effective gate length. The optimally designed proposed device
produces on current (ION) ~0.33 mA and
off current (IOFF) ~5.55fA along with
ION/IOFF=6.08x1010,
Sub-threshold slope (SS)=59.6 mV/decade and drain induced barrier
lowering (DIBL)=82.2 mV/V. This paper also highlights the performance
improvement of the proposed device in terms of both speed and energy
consumption, as compared to that of junctionless Double Gate MOSFET when
implemented as logic gates.